- Ensure precise testing and aging of QFP64, LQFP64, and TQFP64 chips with our reliable Burn-In Socket, designed for maximum stability and dependability. - Ideal for semiconductor engineers, electronic lab technicians, and professionals seeking high-quality tools for chip testing and aging processes. - This Burn-In Socket is essential for electronics manufacturing workshops conducting batch aging tests and labs verifying chip performance and long-term stability. - Streamline your chip testing workflows with this Burn-In Socket, ensuring compatibility with QFP64, LQFP64, and TQFP64 package chips for consistent and accurate results. Key Features: - Functionality: Provides thorough testing and reliable aging for semiconductor chips, enhancing performance assessment. - Compatibility: Specifically designed for QFP64, LQFP64, and TQFP64 packages, ensuring seamless integration into existing workflows. - Performance: Supports rigorous testing environments, helping to identify chip reliability and stability over time. Use Scenarios: 1. In an electronics lab, utilize the Burn-In Socket to conduct performance evaluations on new semiconductor designs before mass production. 2. In a manufacturing setting, implement batch aging tests to ensure the reliability of chips under various environmental conditions. 3. For quality assurance teams, employ the Burn-In Socket to validate chip stability and performance, preventing defects in the final products.